ManufacturerPackagingSeriesPart StatusLogic TypeSupply VoltageNumber of BitsOperating TemperatureMounting TypePackage / CaseSupplier Device Package
Supplier Part Number
Manufacturer Part Number
PriceStock
Manufacturer
Description
Packaging
Series
Part Status
Logic Type
Supply Voltage
Number of Bits
Operating Temperature ...
Mounting Type
Package / Case
Supplier Device Package ...
SN74ABT18640DGGR
SN74ABT18640DGGR
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/TXRX 56-TSSOPTape & Reel (TR)74ABTObsoleteScan Test Device with Inverting Bus Transceivers4.5 V ~ 5.5 V18-40°C ~ 85°CSurface Mount56-TFSOP (0.240", 6.10mm Width)56-TSSOP
SN74ABT8996DWR
SN74ABT8996DWR
Leadtime
2-3 weeks		Texas InstrumentsIC ADDRESSABLE SCAN PORT 24-SOICTape & Reel (TR)74ABTObsoleteAddressable Scan Ports4.5 V ~ 5.5 V10-40°C ~ 85°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
SN74ACT8990FN
SN74ACT8990FN
26+33.9419
Increments of 26
Leadtime
2-3 weeks		Texas InstrumentsIC TEST-BUS CONTROLLER 44-PLCCTube74ACTActiveTest Bus Controller4.5 V ~ 5.5 V160°C ~ 70°CSurface Mount44-LCC (J-Lead)44-PLCC (16.58x16.58)
SN74ACT1073DW
SN74ACT1073DW
1+2.9902
10+2.68333
100+2.19853
500+1.87157
1000+1.57843
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC 16-BIT BUS TERM ARRAY 20-SOICTube74ACTActiveBus Termination Array4.5 V ~ 5.5 V16-40°C ~ 85°CSurface Mount20-SOIC (0.295", 7.50mm Width)20-SOIC
SN74ACT1071D
SN74ACT1071D
200+2.58088
Increments of 200
Leadtime
2-3 weeks		Texas InstrumentsIC 10-BIT BUS TERM ARRAY 14-SOICTube74ACTActiveBus Termination Array4.5 V ~ 5.5 V10-40°C ~ 85°CSurface Mount14-SOIC (0.154", 3.90mm Width)14-SOIC
SN74ABT8952DL
SN74ABT8952DL
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/XCVR 28-SSOPTube74ABTObsoleteScan Test Device with Registered Bus Transceiver4.5 V ~ 5.5 V8-40°C ~ 85°CSurface Mount28-BSSOP (0.295", 7.50mm Width)28-SSOP
SN74ABT8646DL
SN74ABT8646DL
1+11.3137
10+10.2235
100+8.46373
500+7.3701
1000+6.41912
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/XCVR 28-SSOPTube74ABTActiveScan Test Device with Bus Transceiver and Registers4.5 V ~ 5.5 V8-40°C ~ 85°CSurface Mount28-BSSOP (0.295", 7.50mm Width)28-SSOP
SN74ABT8543DL
SN74ABT8543DL
1+13.0784
10+12.0157
100+10.1475
500+9.02696
1000+8.2799
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN TEST DEV/TXRX 28-SSOPTube74ABTActiveScan Test Device with Registered Bus Transceiver4.5 V ~ 5.5 V8-40°C ~ 85°CSurface Mount28-BSSOP (0.295", 7.50mm Width)28-SSOP
SN74ACT8997DW
SN74ACT8997DW
60+9.67434
Increments of 60
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-PATH LINKER 28-SOICTube74ACTActiveSCAN-PATH LINKERS4.5 V ~ 5.5 V40°C ~ 70°CSurface Mount28-SOIC (0.295", 7.50mm Width)28-SOIC
SN74ABT8543DW
SN74ABT8543DW
1+12.049
10+11.0696
100+9.34853
500+8.31618
1000+7.62794
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN TEST DEV/TXRX 28-SOICTube74ABTActiveScan Test Device with Registered Bus Transceiver4.5 V ~ 5.5 V8-40°C ~ 85°CSurface Mount28-SOIC (0.295", 7.50mm Width)28-SOIC
SN74ABT8245DW
SN74ABT8245DW
1+7.35294
10+6.6402
100+5.49706
500+4.78677
1000+4.16912
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN TEST DEV/TXRX 24-SOICTube74ABTActiveScan Test Device with Bus Transceivers4.5 V ~ 5.5 V8-40°C ~ 85°CSurface Mount24-SOIC (0.295", 7.50mm Width)24-SOIC
SN74ABT8646DW
SN74ABT8646DW
1+11.3137
10+10.2235
100+8.46373
500+7.3701
1000+6.41912
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/XCVR 28-SOICTube74ABTActiveScan Test Device with Bus Transceiver and Registers4.5 V ~ 5.5 V8-40°C ~ 85°CSurface Mount28-SOIC (0.295", 7.50mm Width)28-SOIC
SN74ABT8652DL
SN74ABT8652DL
1+13.0784
10+12.0157
100+10.1475
500+9.02696
1000+8.2799
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/XCVR 28-SSOPTube74ABTActiveScan Test Device with Bus Transceiver and Registers4.5 V ~ 5.5 V8-40°C ~ 85°CSurface Mount28-BSSOP (0.295", 7.50mm Width)28-SSOP
SN74ABTE16246DL
SN74ABTE16246DL
1+14
10+12.8667
100+10.8667
500+9.66667
1000+8.86667
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC 11-BIT I-WS BUS TXRX 48-SSOPTube74ABTEActiveIncident-Wave Switching Bus Transceivers4.5 V ~ 5.5 V11-40°C ~ 85°CSurface Mount48-BSSOP (0.295", 7.50mm Width)48-SSOP
SN74ABT8952DW
SN74ABT8952DW
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/XCVR 28-SOICTube74ABTObsoleteScan Test Device with Registered Bus Transceiver4.5 V ~ 5.5 V8-40°C ~ 85°CSurface Mount28-SOIC (0.295", 7.50mm Width)28-SOIC
SN74ABTH16460DL
SN74ABTH16460DL
Leadtime
2-3 weeks		Texas InstrumentsIC REGISTERED TRANSCVR 56SSOPTube74ABTH4-TO-1 Multiplexed/Demultiplexed Transceivers4.75 V ~ 5.5 V5-40°C ~ 85°CSurface Mount56-BSSOP (0.295", 7.50mm Width)56-SSOP
SN74ABT18245ADL
SN74ABT18245ADL
60+10.1569
Increments of 60
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/TXRX 56-SSOPTube74ABTActiveScan Test Device with Bus Transceivers4.5 V ~ 5.5 V18-40°C ~ 85°CSurface Mount56-BSSOP (0.295", 7.50mm Width)56-SSOP
SN74ABT8996DW
SN74ABT8996DW
50+10.0155
Increments of 50
Leadtime
2-3 weeks		Texas InstrumentsIC ADDRESSABLE SCAN PORT 24-SOICTube74ABTActiveAddressable Scan Ports4.5 V ~ 5.5 V10-40°C ~ 85°CSurface Mount24-SOIC (0.295", 7.50mm Width)160-NFBGA (9x13)
SN74ABT18640DL
SN74ABT18640DL
1+12.5588
10+11.5422
100+9.74804
500+8.67157
1000+7.95392
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/TXRX 56-SSOPTube74ABTActiveScan Test Device with Inverting Bus Transceivers4.5 V ~ 5.5 V18-40°C ~ 85°CSurface Mount56-BSSOP (0.295", 7.50mm Width)56-SSOP
CD74ACT283E
CD74ACT283E
1+1.12745
10+1.00686
100+0.784706
500+0.648235
1000+0.511765
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC 4-BIT BIN FILL ADDER 16-DIPTube74ACTActiveBinary Full Adder with Fast Carry4.5 V ~ 5.5 V4-55°C ~ 125°CThrough Hole16-DIP (0.300", 7.62mm)16-PDIP
SN74ABT18502PM
SN74ABT18502PM
1+21.5686
10+19.8941
100+16.9882
500+15.4235
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/TXRX 64-LQFPTray74ABTActiveScan Test Device with Registered Bus Transceiver4.5 V ~ 5.5 V18-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)
SN74ABTH18652APM
SN74ABTH18652APM
1+16.9902
10+15.6108
100+13.1838
500+11.7279
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/TXRX 64-LQFPTray74ABTHActiveScan Test Device With Transceivers And Registers4.5 V ~ 5.5 V18-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)
SN74ABTH182646APM
SN74ABTH182646APM
1+19.1078
10+17.6255
100+15.051
500+13.6647
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/TXRX 64-LQFPTray74ABTHActiveScan Test Device With Transceivers And Registers4.5 V ~ 5.5 V18-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)
SN74ABTH18646APM
SN74ABTH18646APM
1+16.9902
10+15.6108
100+13.1838
500+11.7279
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/TXRX 64-LQFPTray74ABTHActiveScan Test Device With Transceivers And Registers4.5 V ~ 5.5 V18-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)
SN74ABT18504PM
SN74ABT18504PM
1+16.4706
10+15.1373
100+12.7843
500+11.3725
Increments of 1
Leadtime
2-3 weeks		Texas InstrumentsIC SCAN-TEST-DEV/TXRX 64-LQFPTray74ABTActiveScan Test Device with Universal Bus Transceivers4.5 V ~ 5.5 V20-40°C ~ 85°CSurface Mount64-LQFP64-LQFP (10x10)